Boron deposited on silicon substrate

Boron deposited on silicon substrate

A150/0158 Rights Managed

Request low-res file

530 pixels on longest edge, unwatermarked

Request/Download high-res file

Uncompressed file size: 27.6MB

Downloadable file size: 1.4MB

Price image Pricing

Please login to use the price calculator


Caption: Scanning tunnelling micrograph of a deposit of boron on a silicon substrate. The scanning tunnelling microscope (STM) uses a fine point electrode, a few atoms thick at the tip, and is capable of atomic- scale resolution. The tip is brought to within a few angstroms (a few ten- millionths of a millimetre) of the sample's surface. As the electron clouds of the tip and the sample atoms interact, a small 'tunnelling' current passes. The electrode scans across the surface, moving vertically to maintain the tunnelling current. This motion is then processed to produce a map such as that seen here.

Release details: Model release not required. Property release not required.

Keywords: atomic structure, boron, boron on silicon, chemical, chemistry, element, elements, microscopy, particle physics, scanning tunnelling micrograph, stm image, stm imagery

Licence fees: A licence fee will be charged for any media (low or high resolution) used in your project.