Tinted SEM of silk tie.

Tinted SEM of silk tie.

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Credit: R.E. LITCHFIELD/SCIENCE PHOTO LIBRARY

Caption: False-colour scanning electron micrograph showing the twill weave pattern on a silk tie. Magnification: x18 at 35mm size.

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Keywords: cloth, clothes, clothing, material, materials, scanning electron micrograph, sem, silk tie, weave

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