Testing microchips

Testing microchips

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Credit: SWINDON SILICON SYSTEMS/A. STERNBERG/ SCIENCE PHOTO LIBRARY.

Caption: Integrated circuit wafer undergoing probe testing, during its final design stage. The wafer consists of rows of individual integrated circuits (the gold squares), and the test probes can be seen arranged around the edge of an individual integrated circuit.

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Keywords: chip, chip manufacture, computer, electronic, electronics, hardware, high-tech, integrated circuit, microchip, probe, quality control, semiconductor industry, silicon wafer, technology, testing

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