Examining microdevice

Examining microdevice

T395/0115 Rights Managed

Request low-res file

530 pixels on longest edge, unwatermarked

Request/Download high-res file

Uncompressed file size: 40.2MB

Downloadable file size: 2.5MB

Price image Pricing

Please login to use the price calculator


Credit: COLIN CUTHBERT/SCIENCE PHOTO LIBRARY

Caption: Examining microdevice. Technician inspecting a microelectromechanical system (MEMS) with an interference microscope (surface profiler). MEMS are electrical and mechanical devices with micrometre-sized parts. They include tiny robots (nanorobots), as well as miniature laboratories (labs on a chip) which can be used in sensors or diagnostic devices. The surface features of this MEMS, seen on the monitor, have been found to a vertical resolution of one tenth of a nanometre using white light interferometry, the pattern caused by the interaction of two waves of white light. Photographed in the Micromechanics Lab of Newcastle University, England.

Release details: Model release available. Property release not required.

Keywords: britain, british, computer, engineer, engineering, england, english, examination, examining, horizontal, inspecting, inspection, instrument, interference microscope, interferometry, laboratory, light, male, man, mems, microelectromechanical, microelectromechanics, microelectronics, micromechanics, microscopy, monitor, nanotechnology, newcastle university, optical, physicist, physics, researcher, scientist, screen, surface profiler, system, technician, technology, test, testing, uk, united kingdom

Licence fees: A licence fee will be charged for any media (low or high resolution) used in your project.