Examining microdevice

Examining microdevice

T395/0115

Rights Managed

Caption

Examining microdevice. Technician inspecting a microelectromechanical system (MEMS) with an interference microscope (surface profiler). MEMS are electrical and mechanical devices with micrometre-sized parts. They include tiny robots (nanorobots), as well as miniature laboratories (labs on a chip) which can be used in sensors or diagnostic devices. The surface features of this MEMS, seen on the monitor, have been found to a vertical resolution of one tenth of a nanometre using white light interferometry, the pattern caused by the interaction of two waves of white light. Photographed in the Micromechanics Lab of Newcastle University, England.

Release details

Model release available. Property release not required.

 {{ i.shot_duration ? i.shot_duration + ' ' : '' }}{{ i.shot_uhd ? '4K ' : i.hires ? 'HD ' : '' }}{{ i.spl_number }} R{{ i.license }}

  • Add to board
  • Similar {{ mediaType(i) }}