Mass spectrometer

Mass spectrometer

T875/1100 Rights Managed

Request low-res file

530 pixels on longest edge, unwatermarked

Request/Download high-res file

Uncompressed file size: 40.7MB

Downloadable file size: 3.9MB

Price image Pricing

Please login to use the price calculator


Caption: Mass spectrometry. Technician holding a sample tray prior to analysis of the sample by a time of flight secondary ion mass spectrometer (TOF SIMS). The TOF SIMS is used to analyse the surface of a sample. A pulsed ion beam is used to remove molecules from the subject's surface. The molecules are ionised and accelerated towards a detector. The time it takes them to reach the detector depends on their mass. The advantage of this system is that macromolecules (such as polymers or proteins) are not disintegrated by the beam. TOF SIMS is used in coatings research, microelectronics and surface contamination studies.

Release details: Model release available. Property release not required.

Keywords: analysing, analysis, apparatus, chemical, chemistry, equipment, industry, laboratory, male, man, mass spectrometer, researcher, sample tray, secondary ion, specimen, surface, technician, technology, time of flight, tof sims

Licence fees: A licence fee will be charged for any media (low or high resolution) used in your project.