Atomic force microscope

Atomic force microscope

C010/4126 Rights Managed

Request low-res file

530 pixels on longest edge, unwatermarked

Request/Download high-res file

Uncompressed file size: 50.1MB

Downloadable file size: 1.7MB

Price image Pricing

Please login to use the price calculator


Restrictions: Editorial use only

Caption: Atomic force microscope. Scientists loading a sample into an atomic force microscope. These microscopes are used to study surfaces at an atomic level. They use an atomic-sized tip to probe the surface of a material. This allows a three-dimensional map of the surface to be constructed, down to the scale of individual atom. They can also be used to test the hardness of a very small volume of material, by pressing the tip into the material to a known maximum load.

Release details: Model release not available. Property release not available.

Keywords: adult, afm, atomic force microscope, atomic force microscopy, caucasian, equipment, female, human, lab, laboratory, loading, physical, physics, preparing, probe, research, researcher, researching, rkm, sample, scanning force microscope, scanning probe microscopy, scientist, sfm, spm, technological, technology, woman

Licence fees: A licence fee will be charged for any media (low or high resolution) used in your project.