Silicon wafer probe

Silicon wafer probe

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Credit: ANDREW BROOKES, NATIONAL PHYSICAL LABORATORY/SCIENCE PHOTO LIBRARY

Caption: Silicon wafer probe being used to carry out on-wafer testing and monitoring of active silicon microchip circuitry. This is a GSG 150 model probe, where GSG stands for ground-signal-ground, and the pitch of the probe is 150 micrometres). Photographed at the National Physical Laboratory, Teddington, UK.

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