Scanning electron microscope

Scanning electron microscope

C014/5420

Rights Managed

Caption

Laboratory technicians using a scanning electron microscope (SEM). This piece of equipment uses an electron beam to obtain a three-dimensional image of an object. The beam is scanned over the sample in a vacuum, causing the emission of secondary electrons. These secondary electrons are detected and used to form an image that is displayed on the screen. Photographed in Hanoi, Vietnam, in 1985.

Release details

Model release not available. Property release not available.

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