Diffraction experiment, simulation

Diffraction experiment, simulation

C014/7188 Rights Managed

Request low-res file

530 pixels on longest edge, unwatermarked

Request/Download high-res file

Uncompressed file size: 57.2MB

Downloadable file size: 2.3MB

Price image Pricing

Please login to use the price calculator


This image is part of the sequence science and technology: Interference diffraction pattern graphs

Credit: CHRISTIAN KOCH, MICROCHEMICALS/SCIENCE PHOTO LIBRARY

Caption: Diffraction experiment. Simulation showing the variation in the interference pattern produced by light waves passing through a multi-slit aperture. N is the number of slits and D is the distance between slits in micrometres. The wavelength of the light is 633 nanometres. The diffraction causes the light waves to overlap, causing constructive and destructive interference. The intensity of the light (red) is shown on a diffusing screen, and as a curve (white). N varies from 2 to 4 to 16 (top to bottom) and D varies from 1 to 2.5 to 7 from left to right. As N increases, the interference maxima become sharper. As D increases, the maxima converge.

Release details: Model release not required. Property release not required.

Keywords: amplitude, artwork, barrier, constructive, destructive, diffracted, diffracting, diffraction pattern, experiment, experimental, graph, illustration, intensity, interference, interference peaks, interfering, maxima, maximum, model, modeled, modelled, multi-slit, multiple slits, optics, peak, physical, physics, plot, red light, results, sequence, series, simulated, simulation, simulations, slit, slit number variation, slit separation variation, slits, trough, troughs, wave, waveform

Licence fees: A licence fee will be charged for any media (low or high resolution) used in your project.