Optical profiling of MEMS metamaterial

Optical profiling of MEMS metamaterial

C019/9791 Rights Managed

Request low-res file

530 pixels on longest edge, unwatermarked

Request/Download high-res file

Uncompressed file size: 25.1MB

Downloadable file size: 1.7MB

Price image Pricing

Please login to use the price calculator


Credit: CENTER FOR NANOPHASE MATERIALS SCIENCES, ORNL/SCIENCE PHOTO LIBRARY

Caption: Optical profiling of MEMS metamaterial. Optical profilometer test on a MEMS device made from a metamaterial. This device is an integrated nanomechanical thermal transducer designed to increase electromagnetic wave absorption in the THz (terahertz) range. An example of a MEMS (microelectromechanical systems) device, it was developed by researchers from the US Naval Postgraduate School, working at the Center for Nanophase Materials Science at Oak Ridge National Laboratory, USA. Advanced optical profilometry allows mapping of deformations in such structures with sub-nanometre accuracy. This research was published in 2013.

Release details: Model release not required. Property release not required.

Keywords: 2013, 21st century, american, artificial, black background, center for nanophase materials science, cut out, cut outs, cut-out, cut-outs, cutout, cutouts, designed, device, electromagnetic wave absorption, material, materials science, mems, metamaterial, microelectromechanical systems, nanodevice, nanomechanical, nanometre, nanotechnology, new property, no-one, nobody, oak ridge national laboratory, optical profiling, optical profilometer, optical profilometry, ornl, physical, physics, properties, radio waves, research, sensor, terahertz, thermal transducer, thz, us, us naval postgraduate school

Licence fees: A licence fee will be charged for any media (low or high resolution) used in your project.