Credit: RHYS LEWIS & MINH TAN PHAM, AHS, DECD, UNISA/SCIENCE PHOTO LIBRARY

Caption: Double slit interference patterns with variation in distance between slits. When light passes through two parallel slits, the light that passes through each slit interferes with the light passing through the other slit. Where the light waves meet crest to crest, the light interferes constructively, making a brighter light. Where the light meets out of phase, that is, a crest meets a trough, the light interferes destructively, cancelling out and producing a dark region. When a screen is placed in front of the slits, as here, the pattern is seen as alternating bands of light and dark. The distance between the light and dark patches depends on the distance between the slits.

Release details: Model release not required. Property release not required.

Keywords: constructive, demonstration, destructive, double slit, education, educational, experiment, interference, interfering, laser, light, optics, pattern, patterns, properties, property, red, slits, wave, waves

Licence fees: A licence fee will be charged for any media (low or high resolution) used in your project.

Double slit interference patterns

K004/3392 Rights Managed

Downloadable master

Duration: 00:00:25.14

Frame size: 1920x1080

Frame rate: 25

Audio: No

Format: QuickTime, Photo JPEG 100%, progressive scan, square pixels

File size: 513.6M

Original

Capture format: Sony FS700

Codec: Apple ProRes 422 (HQ)

Interlaced: Yes

Please contact Science Photo Library if you require the original, or other formats.

 

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