Double-slit Interference Pattern

Double-slit Interference Pattern

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Caption: Interference pattern observed in a modern-day replica of Thomas Young's double-slit experiment. Here a coherent beam from a diode laser (635 nm) is incident on two closely-spaced slits (25 micron width, and a 45 micron distance between slits). Light transmitted by the two slits diffracts into the free space and the resulting interference fringes are photographed on a screen. This is a classic demonstration of the wave nature of the light. Characteristic laser speckle causes a grainy appearance of the pattern. Digitally manipulated.

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Keywords: 633 nm, coherent, colored laser, demonstration, diffract, diffraction, diode, double-slit, experiment, interference, interference fringes, interference pattern, laser, light, light interference, light wave, monochromatic, optical, optics, physics, red laser, scientific, semiconductor, slit experiment, wavelength

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