Double-slit Interference Pattern

Double-slit Interference Pattern

C022/1834 Rights Managed

Request low-res file

530 pixels on longest edge, unwatermarked

Request/Download high-res file

Uncompressed file size: 38.7MB

Downloadable file size: 4.5MB

Price image Pricing

Please login to use the price calculator


Caption: Interference pattern observed in a modern-day replica of Thomas Young's double-slit experiment. Here a coherent beam from a diode laser (635 nm) is incident on two closely-spaced slits (25 micron width, and a 45 micron distance between slits). Light transmitted by the two slits diffracts into the free space and the resulting interference fringes are photographed on a screen. This is a classic demonstration of the wave nature of the light. Characteristic laser speckle causes a grainy appearance of the pattern. Digitally manipulated.

Release details: Model release not required. Property release not required.

Keywords: 633 nm, coherent, colored laser, demonstration, diffract, diffraction, diode, double-slit, experiment, interference, interference fringes, interference pattern, laser, light, light interference, light wave, monochromatic, optical, optics, physics, red laser, scientific, semiconductor, slit experiment, wavelength

Licence fees: A licence fee will be charged for any media (low or high resolution) used in your project.