Multilayer Laue lenses, SEM

Multilayer Laue lenses, SEM

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Caption: Multilayer Laue lenses (MLL), coloured scanning electron micrograph (SEM). These lenses were carved through a process called reactive ion etching. They are designed to focus high-intensity X-rays to within a single nanometre using instruments like the National Synchrotron Light Source II at Brookhaven National Laboratory, New York, USA. Image published in 2012.

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Keywords: 2012, 21st century, bnl, brookhaven national laboratory, coloured, false-coloured, focal, focus, laue lens, lenses, mll, multilayer laue lenses, nanomaterials, nanoscience, nanotechnology, national synchrotron light source ii, new york, no-one, nobody, north america, north american, nsls ii, optical, optics, orange, physical, physics, research, scanning electron micrograph, scanning electron microscope, sem, technological, technology, united states, us, usa, x-ray diffraction, xray

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