Editorial use only.
Multilayer Laue lenses (MLL), coloured scanning electron micrograph (SEM). These lenses were carved through a process called reactive ion etching. They are designed to focus high-intensity X-rays to within a single nanometre using instruments like the National Synchrotron Light Source II at Brookhaven National Laboratory, New York, USA. Image published in 2012.
Model release not required. Property release not required.