Multilayer Laue lenses, SEM

Multilayer Laue lenses, SEM

C021/9582

Rights Managed

Restrictions:

Editorial use only.

Caption

Multilayer Laue lenses (MLL), coloured scanning electron micrograph (SEM). These lenses were carved through a process called reactive ion etching. They are designed to focus high-intensity X-rays to within a single nanometre using instruments like the National Synchrotron Light Source II at Brookhaven National Laboratory, New York, USA. Image published in 2012.

Release details

Model release not required. Property release not required.

 {{ i.shot_duration ? i.shot_duration + ' ' : '' }}{{ i.shot_uhd ? '4K ' : i.hires ? 'HD ' : '' }}{{ i.spl_number }} R{{ i.license }}

  • Add to board
  • Similar {{ mediaType(i) }}