Silicon carbide tip, TEM

Silicon carbide tip, TEM

C022/8628 Rights Managed

Request low-res file

530 pixels on longest edge, unwatermarked

Request/Download high-res file

Uncompressed file size: 36.7MB

Downloadable file size: 4.4MB

Price image Pricing

Please login to use the price calculator


Caption: Silicon carbide tip, transmission electron micrograph (TEM). This ultrasharp silicon carbide tip is thousands of times more wear-resistant at the nanoscale than previous designs. It is 100,000 times smaller than the tip of a pencil and is intended for nanomanufacturing applications such as bio sensors for healthcare and the environment. It was developed by scientists at the University of Pennsylvania, USA, the University of Wisconsin-Madison, USA, and at IBM Research-Zurich, Switzerland. Image published in December 2011. Magnification: x800,000 when printed at 10 centimetres across.

Release details: Model release not required. Property release not required.

Keywords: 2011, 21st century, american, black-and-white, european, ibm research, ibm research-zurich, materials science, microscope, monochrome, nano, nanomanufacturing, nanoscale tip, nanotechnology, no-one, nobody, silicon carbide, swiss, technological, technology, tem, tip, transmission electron, transmission electron micrograph, university of pennsylvania, university of wisconsin-madison, us

Licence fees: A licence fee will be charged for any media (low or high resolution) used in your project.