Scanning probe thermometry research

Scanning probe thermometry research

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Caption: Scanning probe thermometry research. Scanning probe thermometer invented by an IBM research team. This breakthrough technique enables the accurate measurement of the temperature of nano and macro size objects. This has applications in characterising the temperature of new transistor designs. It was developed by scientists in Switzerland from IBM and ETH Zurich. The results (with a patent pending) were published in 2016, in the journal 'Nature Communications'. Photographed at the Binnig and Rohrer Nanotechnology Center at IBM Research in Zurich, Switzerland.

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Keywords: 2016, 21st century, apparatus, binnig and rohrer nanotechnology center, device, electronics, engineering, equipment, eth zurich, europe, european, ibm zurich, invention, lab, laboratory, nano, nanoscale, nanotechnology, no-one, nobody, physical, physics, research, scanning probe thermometer, scanning probe thermometry, swiss, switzerland, technological, technology, temperature measurements, transistors, workshop, zurich

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