Measuring dielectric properties

Measuring dielectric properties

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Credit: ANDREW BROOKES, NATIONAL PHYSICAL LABORATORY/SCIENCE PHOTO LIBRARY

Caption: Measuring dielectric properties. Researcher adjusting ellipsometric equipment. Ellipsometry is an optical technique that analyses the properties of dielectric materials, such as thin films (layers of material that are less than a millimetre thick). Dielectric materials are non-conducting substances that have unique properties in response to an electric field. Photographed at the National Physical Laboratory, in Teddington, UK.

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