C002/8460 Rights Managed
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Downloadable file size: 779.4KB
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Keywords: 633 nm, beam, demo, demonstration, diffract, diffraction, diode, double slit, double-slit, experiment, fringe, interference, interference pattern, lab, laboratory, laser, light, monochromatic, optical, optics, photonics, physics, radiation, science, scientific, semiconductor, speckle, technological, technology, wavelength