Scanning electron microscope, artwork

Scanning electron microscope, artwork

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Credit: CLAUS LUNAU/SCIENCE PHOTO LIBRARY

Caption: Scanning electron microscope (SEM), computer artwork. An SEM uses an electron beam (vertical yellow line) to obtain a three-dimensional image of an object at magnifications much higher than can be obtained using light waves. The beam is scanned over the sample (bottom left) in a vacuum, causing the emission of secondary electrons (diagonal yellow line). These secondary electrons are detected and used to form the image, which is displayed here on a screen.

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Keywords: artwork, cut out, cut outs, cut-out, cut-outs, cutout, cutouts, device, diagram, electron beam, equipment, illustration, instrument, machine, magnifying, physical, physics, sample, scanning electron microscope, screen, specimen, technological, technology, vacuum, white background

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