Atomic force micrograph at atomic-scale resolution of a thin co-polymer coating on a silicon substrate. The co-polymer coating has been applied chemically. The topographical information obtained by the microscope has been processed to produce a contour map of the sample. An understanding of the bonding mechanism between polymers and silicon is of importance in the microelectronics industry. Longitudinal magnification is about x500 at 35mm size, the vertical scale has been exaggerated by a further 25x.
Model release not required. Property release not required.