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Tinted SEM of silk tie.

H120/0109

Rights Managed

27.2 MB (3.1 MB compressed)

3828 x 2480 pixels

32.5 x 21.1 cm ⏐ 12.8 x 8.3 in (300dpi)

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R.E. LITCHFIELD / SCIENCE PHOTO LIBRARY R.E. LITCHFIELD / SCIENCE PHOTO LIBRARY

False-colour scanning electron micrograph showing the twill weave pattern on a silk tie. Magnification: x18 at 35mm size.

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