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Tinted SEM of silk tie.

Tinted SEM of silk tie.

H120/0109

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Credit

R.E. LITCHFIELD / SCIENCE PHOTO LIBRARY R.E. LITCHFIELD / SCIENCE PHOTO LIBRARY

Caption

False-colour scanning electron micrograph showing the twill weave pattern on a silk tie. Magnification: x18 at 35mm size.

Release details

Model release not required. Property release not required.

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