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Testing microchips

Testing microchips

T380/0020

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Credit

SWINDON SILICON SYSTEMS / A. STERNBERG / SCIENCE PHOTO LIBRARY. SWINDON SILICON SYSTEMS / A. STERNBERG / SCIENCE PHOTO LIBRARY.

Caption

Integrated circuit wafer undergoing probe testing, during its final design stage. The wafer consists of rows of individual integrated circuits (the gold squares), and the test probes can be seen arranged around the edge of an individual integrated circuit.

Release details

Model release not required. Property release not required.

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