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Microscope inspection of a processed silicon wafer

Microscope inspection of a processed silicon wafer

T380/0215

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Credit

ALFRED PASIEKA / SCIENCE PHOTO LIBRARY ALFRED PASIEKA / SCIENCE PHOTO LIBRARY

Caption

Chip under a microscope. View of a processed silicon wafer under the lens of a microscope for inspection.

Release details

Model release not required. Property release not required.

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