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Atom probe analysis, SEM

Atom probe analysis, SEM

C021/3631

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50.2 MB (2.9 MB compressed)

4503 x 3893 pixels

38.1 x 33.0 cm ⏐ 15.0 x 13.0 in (300dpi)

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Credit

AMMRF, UNIVERSITY OF SYDNEY / SCIENCE PHOTO LIBRARY AMMRF, UNIVERSITY OF SYDNEY / SCIENCE PHOTO LIBRARY

Caption

Coloured scanning electron micrograph (SEM) of a sample of aluminium (blue rod) being prepared for atom probe tomography (APT). The sample is welded to a platinum manipulation rod (right) so that it can be moved and correctly positioned. The sample will be welded to a silicon post (bottom left) then detached from the manipulator using an ion beam, at which point the sample will be ready for analysis. APT is an imaging technique used to visualise the position of each atom in a sample, along with its chemical composition.

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