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Transmission electron microscope cables

Transmission electron microscope cables

C022/8398

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Credit

IBM RESEARCH / SCIENCE PHOTO LIBRARY IBM RESEARCH / SCIENCE PHOTO LIBRARY

Caption

Transmission electron microscope (TEM) cables. Inner cables within a TEM in a research laboratory. This microscopy technique uses a beam of electrons which is transmitted through an ultra-thin slice of the specimen being studied. Photographed in 2013, at the Binnig and Rohrer Nanotechnology Center at IBM Research-Zurich, Switzerland.

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Model release not required. Property release not required.

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