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Semiconductor microscopy, IBM research

Semiconductor microscopy, IBM research

C022/8399

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IBM RESEARCH / SCIENCE PHOTO LIBRARY IBM RESEARCH / SCIENCE PHOTO LIBRARY

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Caption

Semiconductor microscopy, IBM research. French semiconductor engineer Marilyne Sousa using a transmission electron microscope (TEM) in a noise-free laboratory at the Binnig and Rohrer Nanotechnology Center at IBM Research-Zurich, Switzerland. She is part of the Advanced Functional Materials research group, where she performs structural characterization of thin oxide films and III-V materials for high-mobility channels for technology nodes smaller than 14 nanometres. Photographed in October 2013.

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