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Silicon carbide tip, TEM

Silicon carbide tip, TEM

C022/8628

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Credit

IBM RESEARCH / SCIENCE PHOTO LIBRARY IBM RESEARCH / SCIENCE PHOTO LIBRARY

Caption

Silicon carbide tip, transmission electron micrograph (TEM). This ultrasharp silicon carbide tip is thousands of times more wear-resistant at the nanoscale than previous designs. It is 100,000 times smaller than the tip of a pencil and is intended for nanomanufacturing applications such as bio sensors for healthcare and the environment. It was developed by scientists at the University of Pennsylvania, USA, the University of Wisconsin-Madison, USA, and at IBM Research-Zurich, Switzerland. Image published in December 2011. Magnification: x800,000 when printed at 10 centimetres across.

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