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Neutral molecular beam surface probe

Neutral molecular beam surface probe

C029/6664

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Credit

US DEPARTMENT OF ENERGY / SCIENCE PHOTO LIBRARY US DEPARTMENT OF ENERGY / SCIENCE PHOTO LIBRARY

Caption

Neutral molecular beam surface probe. This device allows secondary ion mass spectrometry (SIMS) to be used to analyse non-conducting materials. The probe system permits the production of high energy beams of sulphur hexafluoride. These negative ions can be accelerated to high energy by electric fields. Since the internal vibrations of the molecule cause the electrons to be ejected, the beam is not de-focused. The remaining charged particles can be skimmed off electrically or magnetically, creating a high-energy neutral beam. The neutral molecular beam surface probe is used in polymer development, composite materials research, and biotechnology. Photographed on 30 June 2014.

Release details

Model release not required. Property release not required.

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