ANDREW BROOKES, NATIONAL PHYSICAL LABORATORY / SCIENCE PHOTO LIBRARY ANDREW BROOKES, NATIONAL PHYSICAL LABORATORY / SCIENCE PHOTO LIBRARY
X-ray materials analysis equipment. Researcher adjusting the controls of an X-ray photoelectron spectrometer (XPS). This machine is used to analyse the surface chemistry of a material. It measures the composition, empirical formula, chemical state and electronic state of elements found within the material. Photographed at the National Physical Laboratory, in Teddington, UK.
Model release available. Property release not required.