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X-ray materials analysis equipment

X-ray materials analysis equipment

C002/4032

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Credit

ANDREW BROOKES, NATIONAL PHYSICAL LABORATORY / SCIENCE PHOTO LIBRARY ANDREW BROOKES, NATIONAL PHYSICAL LABORATORY / SCIENCE PHOTO LIBRARY

Caption

X-ray materials analysis equipment. Close up of an X-ray photoelectron spectrometer (XPS). This machine is used to analyse the surface chemistry of a material. It measures the composition, empirical formula, chemical state and electronic state of elements found within the material. Photographed at the National Physical Laboratory, in Teddington, UK.

Release details

Model release not available. Property release not required.

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