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Measuring dielectric properties

Measuring dielectric properties

C002/4047

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Credit

ANDREW BROOKES, NATIONAL PHYSICAL LABORATORY / SCIENCE PHOTO LIBRARY ANDREW BROOKES, NATIONAL PHYSICAL LABORATORY / SCIENCE PHOTO LIBRARY

Caption

Measuring dielectric properties. Researcher adjusting ellipsometric equipment. Ellipsometry is an optical technique that analyses the properties of dielectric materials, such as thin films (layers of material that are less than a millimetre thick). Dielectric materials are non-conducting substances that have unique properties in response to an electric field. Photographed at the National Physical Laboratory, in Teddington, UK.

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