CLAUS LUNAU / SCIENCE PHOTO LIBRARY CLAUS LUNAU / SCIENCE PHOTO LIBRARY
Atomic force microscopy methods. Artwork showing the methods of operation of an atomic force microscope and a graph of the results on different surfaces. Both set-ups use a laser beam (at upper right in each diagram), reflected off a probe on the surface, with a detector (at upper left in each diagram). The method at left involves the probe oscillating as it moves across the surface The method at right involves moving the surface being moved up and down as the probe moves across it. The graph shows how the different methods can image a surface in different ways, ranging from hard (lower left) to soft (upper right).
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