KARL GAFF / SCIENCE PHOTO LIBRARY KARL GAFF / SCIENCE PHOTO LIBRARY
Ellipsometer, 3D illustration. An ellipsometer is used to measure the refractive index and thickness of a semi-transparent thin film. A laser (from left) is directed at the sample (blue) through a polariser. A detector and analyser (at right) intercept the light reflected from the sample. Changes in the polarisation of the light give information on the sample.
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