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Ellipsometer, 3D illustration

Ellipsometer, 3D illustration

C037/8970

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Credit

KARL GAFF / SCIENCE PHOTO LIBRARY KARL GAFF / SCIENCE PHOTO LIBRARY

Caption

Ellipsometer, 3D illustration. An ellipsometer is used to measure the refractive index and thickness of a semi-transparent thin film. A laser (from left) is directed at the sample (blue) through a polariser. A detector and analyser (at right) intercept the light reflected from the sample. Changes in the polarisation of the light give information on the sample.

Release details

Model release not required. Property release not required.

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