SEM and TEM

A scanning electron microscope (SEM) uses an electron beam to scan the surface of a specimen. Electrons are emitted and reflected from the surface and gathered by a detector to build a spectacular black and white image. It reveals details of less than 1 nanometer in size and magnifies from 5 to 500,000 times. Colour is added digitally. Transmission electron microscopy (TEM) uses an ultrathin specimen imaged at considerably higher magnification to reveal the internal structure of a sample.

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